Electron Microscopy of Nanotubes

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(310 Seiten)
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ISBN-13:
9781402073618
Einband:
Book
Erscheinungsdatum:
31.05.2003
Seiten:
310
Autor:
Zhong-lin Wang
Gewicht:
659 g
Format:
242x165x27 mm
Sprache:
Englisch
Beschreibung:

Preface. List of Contibutors. 1. Single walled carbon nanotubes; L.C. Qin. 2. Electron diffraction and microscopy of single-wall carbon nanotube bundles; J.F. Colomer, G.van Tendeloo. 3. Nanodiffraction of carbon nanotubes; J.M. Cowley. 4. The smallest carbon nanotubes; N. Wang. 5. EELS of carbon nanotubes and onions; T. Stöckli. 6. Carbon nanostructures under the electron beam: Formation of new structures and in-situ study of radiation-induced processes; S. Trasobares, P.M. Ajayan. 7. In-situ mechanical properties of nanotubes and nanowires; Z.l. Wang. 8. In-situ field emission of carbon nanotubes; Z.l. Wang. 9. In-situ electric transport of carbon nanotubes; Z.l. Wang. 10. Electron microscopy of boron nitride nanotubes; D. Golberg, Y. Bando. 11. Inorganic nanoparticles with fullerene-like structure and inorganic nanotubes; R. Tenne, R. Popovitz-Biro.
Written by prominent scientists, this book is the first to specifically address the theory, techniques, and application of electron microscopy and associated techniques for nanotube research, a topic that is impacting a variety of fields, such as nanoelectronics, flat panel display, nanodevices, and novel instrumentation.

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